ICP-ToF-MS (LECO, RENAISSANCE)
The methods based on the Time Of Flight Inductively Coupled Plasma-Mass Spectrometry (TOF-ICP-MS) provide high precision and reliable element trace analysis detection in solids, liquid or gases samples of various materials and alloys. The detection limit of the methods ranges from the parts per million (ppm) (routine analysis for industrial production applications) to the parts per billion (ppb) or parts per trillion (ppt) levels for research and development purposes. It can also identify trace contamination and unknown chemical compounds in alloys. These methods help to solve many quality analysis problems because elemental trace analysis techniques are available for a wide range of materials and alloys.
The spectrum shows elements different from those of the alloy composition (Mg, Al, Si, Cu). . In particular impurities of Ca, V, Mn, Zn, Ga, Rh, Sr, Ce, Pb are seen.
Principle of ICP-ToF-MS
ICP-ToF-MS means Time of Flight Inductively Coupled Plasma Mass Spectroscopy which is a new generation of elementary analysis methods of materials or alloys in the form of soild, liquid, or gas
A chemical analysis using plasma which is inductively coupled (the plasma is a state of the matter which contains electrons and ionised atoms ) is based on the principles of vaporisation, dissociation and ionisation of elements when they are introduced in the hot plasma These ions can be identified according to their mass by using a TOF axial mass analyser. A numeric system processes the data and allows a simultaneous of multi elements . The rate of the data acquisition of the spectrum is 30 000 spectra/s. This high rate has no effect on the sensitivity of the data and on the number of data to e processed.
Our ICP-ToF-MS system is equipped with a Excimer LASER which allows deep profile analysis.
The methods based on the Time Of Flight Inductively Coupled Plasma-Mass Spectrometry (TOF-ICP-MS) provide high precision and reliable element trace analysis detection in solids, liquid or gases samples of various materials and alloys. The detection limit of the methods ranges from the parts per million (ppm) (routine analysis for industrial production applications) to the parts per billion (ppb) or parts per trillion (ppt) levels for research and development purposes. It can also identify trace contamination and unknown chemical compounds in alloys. These methods help to solve many quality analysis problems because elemental trace analysis techniques are available for a wide range of materials and alloys.
Recent analysis of a Si-Cu-Mg-Al solid sample using a laser ablation
The spectrum shows elements different from those of the alloy composition (Mg, Al, Si, Cu). . In particular impurities of Ca, V, Mn, Zn, Ga, Rh, Sr, Ce, Pb are seen.
Principle of ICP-ToF-MS
ICP-ToF-MS means Time of Flight Inductively Coupled Plasma Mass Spectroscopy which is a new generation of elementary analysis methods of materials or alloys in the form of soild, liquid, or gas
A chemical analysis using plasma which is inductively coupled (the plasma is a state of the matter which contains electrons and ionised atoms ) is based on the principles of vaporisation, dissociation and ionisation of elements when they are introduced in the hot plasma These ions can be identified according to their mass by using a TOF axial mass analyser. A numeric system processes the data and allows a simultaneous of multi elements . The rate of the data acquisition of the spectrum is 30 000 spectra/s. This high rate has no effect on the sensitivity of the data and on the number of data to e processed.
Our ICP-ToF-MS system is equipped with a Excimer LASER which allows deep profile analysis.
 ICP-ToF-MS |